cient Spectral Techniques for Sequential ATPG

We present a new test generation procedure for sequen tial circuits using spectral techniques Iterations of lter ing via compaction and spectral analysis of the ltered test set are performed for each primary input extracting in herent spectral information embedded within the test se quence This information when viewed in the frequency domain reveals the characteristics of the input spectrum These spectral characteristics are then used to generate future vectors We develop a fault dropping technique to speed up the process We show that very high fault cov erages and small vector sets are consistently obtained in short execution times for sequential benchmark circuits